Title :
Quantum process tomography with entangled photons
Author :
Mitchell, M.W. ; Ellenor, C.W. ; Lundeen, J.S. ; Resch, K.J. ; Steinberg, A.M.
Author_Institution :
Dept. of Phys., Toronto Univ., Ont., Canada
Abstract :
Summary form only given. Using entangled photons from parametric down-conversion as optical qubits, we characterize single- and multiple-qubit operations by quantum process tomography. This allows complete characterization of the operations, including decoherence.
Keywords :
optical tomography; quantum computing; quantum entanglement; quantum optics; decoherence; entangled photons; optical qubits; parametric down-conversion; quantum process tomography; qubit operations; Information processing; Nonlinear optics; Optical computing; Optical filters; Optical polarization; Optical retarders; Physics; Quantum computing; Quantum entanglement; Single photon emission computed tomography;
Conference_Titel :
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-749-0
DOI :
10.1109/QELS.2003.238206
