Title :
Subpixel parameter estimation for elliptical shapes using image sequences
Author :
Reed, James Michael ; Hutchinson, Seth A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
We present a method of ellipse parameter estimation that can be used in performing automated inspection of circular features. In our method, several digital images are taken of each part as it moves past a camera, creating an image sequence. Image enhancement is performed using the image sequence, yielding a high-resolution image. Subpixel edge detection is performed on the high-resolution image, producing a set of data points that is used for ellipse parameter estimation
Keywords :
automatic optical inspection; computer vision; edge detection; image enhancement; image sequences; parameter estimation; automated inspection; circular feature inspection; data points; digital images; ellipse parameter estimation; elliptical shapes; image enhancement; image sequences; subpixel edge detection; Cameras; Image edge detection; Image enhancement; Image resolution; Image sequences; Inspection; Parameter estimation; Printed circuits; Shape; Streaming media;
Conference_Titel :
Multisensor Fusion and Integration for Intelligent Systems, 1994. IEEE International Conference on MFI '94.
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2072-7
DOI :
10.1109/MFI.1994.398403
