DocumentCode
2669059
Title
Subpixel parameter estimation for elliptical shapes using image sequences
Author
Reed, James Michael ; Hutchinson, Seth A.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear
1994
fDate
2-5 Oct 1994
Firstpage
567
Lastpage
574
Abstract
We present a method of ellipse parameter estimation that can be used in performing automated inspection of circular features. In our method, several digital images are taken of each part as it moves past a camera, creating an image sequence. Image enhancement is performed using the image sequence, yielding a high-resolution image. Subpixel edge detection is performed on the high-resolution image, producing a set of data points that is used for ellipse parameter estimation
Keywords
automatic optical inspection; computer vision; edge detection; image enhancement; image sequences; parameter estimation; automated inspection; circular feature inspection; data points; digital images; ellipse parameter estimation; elliptical shapes; image enhancement; image sequences; subpixel edge detection; Cameras; Image edge detection; Image enhancement; Image resolution; Image sequences; Inspection; Parameter estimation; Printed circuits; Shape; Streaming media;
fLanguage
English
Publisher
ieee
Conference_Titel
Multisensor Fusion and Integration for Intelligent Systems, 1994. IEEE International Conference on MFI '94.
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2072-7
Type
conf
DOI
10.1109/MFI.1994.398403
Filename
398403
Link To Document