Title :
Design and implementation of SPI bus protocol with Built-in-self-test capability over FPGA
Author :
Saha, Simanto ; Rahman, Md Arifur ; Thakur, Anita
Author_Institution :
Dept. of Electron. & Commun. Eng., Khulna Univ. of Eng. & Technol., Khulna, Bangladesh
Abstract :
The Serial-Peripheral Interface (SPI) protocol is one of the important bus protocols for connecting with peripheral devices form microprocessor. The complexity of the circuits has aroused with the enormous advancement of IC technology. So, in order to lessen the product failure self-testability in hardware is demanded a lot in recent times. The necessity of self-testability will lead to a solution called Built-in-self-test (BIST). BIST is an effective solution to reduce the huge circuit testing cost. This paper represents designing and implementation of SPI protocol with BIST capability over FPGA. The need of programming for setting up a network with two devices is no longer needed in this proposed system. To accomplish compact, stable and reliable data transmission, the SPI is designed with Verilog HDL language and synthesized on Spartan 2 FPGA. An EEPROM and FPGA Spartan 2 are used for the communication testing where the FPGA is master and EEPROM is a Slave.
Keywords :
EPROM; built-in self test; field programmable gate arrays; microprocessor chips; peripheral interfaces; protocols; BIST; EEPROM; IC technology; SPI bus protocol; Spartan 2 FPGA; Verilog HDL language; built-in-self-test capability; bus protocols; circuit testing cost; communication testing; data transmission; microprocessor; peripheral devices; product failure self-testability; serial-peripheral interface protocol; Built-in self-test; Clocks; Field programmable gate arrays; Generators; Hardware design languages; Protocols; Embedded built-in-self-test architecture; FPGA; Serial-Peripheral Interface; Verilog HDL;
Conference_Titel :
Electrical Engineering and Information & Communication Technology (ICEEICT), 2014 International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4799-4820-8
DOI :
10.1109/ICEEICT.2014.6919076