• DocumentCode
    2669276
  • Title

    Reducing risk when managing the development of complex electronic systems

  • Author

    Donnelly, Christopher F.

  • Author_Institution
    ZYCAD Federal Services Group, Mt. Olive, NJ, USA
  • fYear
    1990
  • fDate
    21-25 May 1990
  • Firstpage
    1054
  • Abstract
    ZYCAD Federal Services Group has developed a simulation environment and a methodology for studying the Joint Integrated Avionics Working Group (JIAWG) computer module specifications under the demonstration of avionic modules exchangeability via simulation (DAMES) program. The simulation environment enables computer systems to the integrated and tested for compliance with hardware and software specifications without actually fabricating the computer system. The methodology enables specifications to be broken down into a list of requirements for easy identification of testing requirements, possible test scenarios, and needed test results. The simulation environment is detailed, explaining how the computer systems are integrated and tested. The methodology is discussed, explaining the breakdown of specification requirements, identifying testing requirements, test scenarios, and analyzing results. Results from the DAMES program are discussed, identifying errors and insufficiencies with the present JIAWG computer modules and specifications. It is shown that the use of advanced simulation technology will reduce the risk when managing the development of complex electronic systems
  • Keywords
    CAD; aerospace computing; digital simulation; electronic engineering computing; modules; software engineering; CAD; DAMES program; JIAWG computer modules; Joint Integrated Avionics Working Group; ZYCAD; aerospace; avionic modules exchangeability; complex electronic systems; computer module specifications; errors; simulation environment; specification; testing requirements; Aerospace electronics; Computational modeling; Computer errors; Computer simulation; Electric breakdown; Hardware; Risk management; Software testing; System testing; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1990.112913
  • Filename
    112913