DocumentCode :
2669322
Title :
Built-in self calibration for process variation in single-loop continuous-time sigma-delta modulators
Author :
Garcia, Julian ; Rusu, Ana
Author_Institution :
Sch. of Inf. & Commun. Technol. (ICT), R. Inst. of Technol. (KTH), Kista, Sweden
fYear :
2010
fDate :
12-15 Dec. 2010
Firstpage :
1136
Lastpage :
1139
Abstract :
A novel built-in self calibration technique for single-loop continuous-time sigma-delta modulators is proposed. Using out-of-band test signal injection and digital cancellation, this technique provides an area efficient, highly digital calibration structure to counteract gain variations in the loop filter. The calibration methodology and mathematical analysis are presented using a 2nd order multibit sigma-delta modulator as a proof of concept. The effect of the finite gain-bandwidth of amplifiers is included when evaluating the calibration method. The proposed technique is validated through corner simulations using behavioral models and it shows that degradation in the signal-to-noise-plus-distortion ratio can be counteracted.
Keywords :
built-in self test; circuit noise; digital filters; sigma-delta modulation; built-in self calibration; continuous-time modulators; digital calibration structure; digital cancellation; finite gain-bandwidth; loop filter; multibit sigma-delta modulator; out-of-band test signal injection; sigma-delta modulators; signal-to-noise-plus-distortion ratio; single-loop modulators; Educational institutions; Indexes; Analog-to-digital converter (ADC); continuous-time; digital calibration; process variations; sigma-delta modulator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-8155-2
Type :
conf
DOI :
10.1109/ICECS.2010.5724717
Filename :
5724717
Link To Document :
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