Title :
Second-harmonic generation and reflectance-difference: a meeting of two surface spectroscopies
Author :
Kwon, J. ; Downer, M.C.
Author_Institution :
Texas Mater. Inst., Texas Univ., Austin, TX, USA
Abstract :
Second-harmonic (SH) and reflectance-difference (RD) spectra of vicinal oxidized Si(001) surfaces near the E/sub 1/ resonance reveal similar structure in their lowest-order anisotropic Fourier component, suggesting a common origin in the step-edges.
Keywords :
elemental semiconductors; optical harmonic generation; reflectivity; silicon; ultraviolet spectra; Si; anisotropic Fourier component; oxidized Si(001) surfaces; reflectance-difference; second-harmonic generation; surface spectroscopies; Anisotropic magnetoresistance; Geometrical optics; Nonlinear optical devices; Nonlinear optics; Optical devices; Optical harmonic generation; Optical materials; Pulse measurements; Spectroscopy; Surface emitting lasers;
Conference_Titel :
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-749-0
DOI :
10.1109/QELS.2003.238322
