Title :
DFTT: Design for Trojan Test
Author :
Jin, Yier ; Kupp, Nathan ; Makris, Yiorgos
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
Abstract :
Due to the globalization of the Integrated Circuit (IC) manufacturing industry, hardware Trojans constitute an increasingly probable threat to both commercial and military applications. As traditional testing methods fall short in finding hardware Trojans, several specialized detection methods have surfaced. To facilitate research in this area and embed internal barriers to prevent Trojan attacks both at the design level and at the manufacturing level, we propose a Design-for-Trojan-Test (DFTT) methodology. DFTT is based on one key principle: increase the complexity for hardware Trojan attackers, thereby making successful hardware Trojan-based attacks extremely difficult to accomplish. A DFTT tool is also developed to automate the hardening process. The effectiveness of our Trojan prevention method is demonstrated on the Trivium encryption core.
Keywords :
design for testability; integrated circuit manufacture; integrated circuit testing; invasive software; Trivium encryption core; design-for-Trojan-test methodology; hardening process; hardware Trojan attackers; integrated circuit manufacturing industry; Cryptography; Hardware; Trojan horses;
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-8155-2
DOI :
10.1109/ICECS.2010.5724725