Title :
2009 IRPS tutotial program
Abstract :
Provides an abstract for each of the tutorial presentations and a brief professional biography of each presenter. The complete presentations were not made available for publication as part of the conference proceedings.
Keywords :
Acceleration; Circuits; Degradation; Electric breakdown; Insulation; Niobium compounds; Plasma temperature; Statistics; Stress; Titanium compounds;
Conference_Titel :
Reliability Physics Symposium, 2009 IEEE International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-2888-5
DOI :
10.1109/IRPS.2009.5173211
