Title :
2006 International Conference on Design and Test of Integrated Systems in Nanoscale Technology - DTIS 2006 [Front cover]
Abstract :
The following topics are dealt with: software radio; simulation of CNTFET-based circuits; analog circuit design; embedded system design; circuit design verification; RF circuit design; innovative technologies and synthesis; mixed signal systems and hard-sensor electronics; circuit simulation and validation; SoC and NoC design: low power design and wireless systems; test trends and SiP testing; advances in test and fault tolerance; defect and fault modelling; BIST techniques; device modeling; circuit characterization and modelling
Keywords :
analogue integrated circuits; built-in self test; carbon nanotubes; circuit simulation; embedded systems; fault simulation; fault tolerance; field effect transistors; integrated circuit design; integrated circuit modelling; integrated circuit testing; low-power electronics; mixed analogue-digital integrated circuits; network-on-chip; semiconductor device models; software radio; system-in-package; system-on-chip; BIST techniques; CNTFET circuits; NoC design; RF circuit; SiP testing; SoC design; analog circuit; circuit characterization; circuit design verification; circuit modelling; circuit simulation; device modeling; embedded system; fault modelling; fault tolerance; hard-sensor electronics; low power design; mixed signal systems; software radio; wireless systems;
Conference_Titel :
Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on
Conference_Location :
Tunis
Print_ISBN :
0-7803-9726-6
DOI :
10.1109/DTIS.2006.1708735
