• DocumentCode
    2669777
  • Title

    Security of AES Sbox designs to power analysis

  • Author

    Boey, Kean Rong ; Hodgers, P. ; Lu, Yingxi ; O´Neill, Maire ; Woods, Roger

  • Author_Institution
    Inst. of Electron., Commun. & Inf. Technol. (ECIT), Queen´´s Univ. Belfast, Belfast, UK
  • fYear
    2010
  • fDate
    12-15 Dec. 2010
  • Firstpage
    1232
  • Lastpage
    1235
  • Abstract
    Cryptographic devices with the Advanced Encryption Standard (AES) encryption algorithm are vulnerable to side channel attack, in particular, differential power analysis (DPA). Differential power analysis can be used to reveal the secret key in AES by monitoring the power consumption of the internal circuit and applying statistical processing. In this paper, an evaluation of power analysis attacks of six different AES Sbox designs, namely sum of product (SOP), product of sum (POS), table lookup (TBL), composite field (CF), positive polarity Reed-Miller (PPRM) and 3 stages PPRM, is presented. Comparison of the different AES Sbox implementations in terms of size, performance and SNR analysis is also performed. The results show that the composite field Sbox design is more resistant to attack and smaller than other Sbox designs but operates at a slower speed. This paper also presents a Random Clock mechanism that can be used to increase the resistance of the AES composite field Sbox design to power analysis attack by reducing the overall SNR by 78%.
  • Keywords
    clocks; cryptography; field programmable gate arrays; power consumption; AES Sbox designs security; FPGA; advanced encryption standard; cryptographic devices; differential power analysis; internal circuit; positive polarity Reed-Miller; power consumption; product of sum; random clock mechanism; side channel attack; statistical processing; sum of product; table lookup; Clocks; Cryptography; Power analysis; cryptography; random clock;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4244-8155-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2010.5724741
  • Filename
    5724741