DocumentCode
2670078
Title
Sub-diffraction-limit imaging based on the topographic contrast of differential confocal microscopy
Author
Chau-Hwang Lee ; Hui-Yu Chiang ; Hong-Yao Mong
Author_Institution
Inst. of Appl. Sci. & Eng. Res., Acad. Sinica, Taipei, Taiwan
fYear
2003
fDate
6-6 June 2003
Abstract
Using the nanometer topographic sensitivity of differential confocal microscopy, we detect surface features with lateral dimensions smaller than the diffraction limit without fluorescence labeling. Lateral resolution as high as 0.2/spl lambda/ is achieved with maximum-likelihood image restoration.
Keywords
image resolution; image restoration; maximum likelihood estimation; optical microscopy; surface topography; differential confocal microscopy; maximum-likelihood image restoration; subdiffraction-limit imaging; surface features; topographic contrast; Computer vision; Diffraction; Fluorescence; High-resolution imaging; Image resolution; Image restoration; Labeling; Maximum likelihood detection; Microscopy; Surface topography;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-749-0
Type
conf
DOI
10.1109/QELS.2003.238527
Filename
1276287
Link To Document