DocumentCode
2670209
Title
The dynamic infrared missile evaluator (DIME) and electro-optical signature analysis system (EOSAS) facilities
Author
Vogel, George A. ; Huber, Edward G.
Author_Institution
Wright Res. & Dev. Center, Wright-Patterson AFB, OH, USA
fYear
1990
fDate
21-25 May 1990
Firstpage
1340
Abstract
The Electronic Warfare Division of the avionics laboratory at the Wright Research and Development Center (WRDC) has two in-house facilities which are used in the evaluation of conceptual infrared (IR) and electrooptical (EO) countermeasure techniques. The first facility, called the dynamic infrared missile evaluator (DIME), is a 6-degree of freedom hardware-in-the-loop IR missile simulator. This system is used to evaluate flare and jammer techniques on actual missile guidance and control units under real-time dynamic fly-out conditions. The second facility, called the electrooptical signature analysis system (EOSAS), is an image processing system with software developed to create images of aircraft and characterize their resulting visual and/or infrared signature. This system is used to design and evaluate observable reduction techniques. Both systems provide WRDC with a unique in-house capability for research and development of IR/EO countermeasure techniques
Keywords
aerospace computing; aerospace simulation; aircraft instrumentation; computerised picture processing; electronic countermeasures; military computing; missiles; real-time systems; IR missile simulator; aircraft; avionics laboratory; computerised picture processing; countermeasure; dynamic infrared missile evaluator; electro-optical signature analysis system; flare; image processing; jammer; missile guidance; real-time dynamic fly-out conditions; Aerospace electronics; Control systems; Electronic countermeasures; Electronic warfare; Image analysis; Jamming; Laboratories; Missiles; Real time systems; Research and development;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
Conference_Location
Dayton, OH
Type
conf
DOI
10.1109/NAECON.1990.112968
Filename
112968
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