DocumentCode :
2670209
Title :
The dynamic infrared missile evaluator (DIME) and electro-optical signature analysis system (EOSAS) facilities
Author :
Vogel, George A. ; Huber, Edward G.
Author_Institution :
Wright Res. & Dev. Center, Wright-Patterson AFB, OH, USA
fYear :
1990
fDate :
21-25 May 1990
Firstpage :
1340
Abstract :
The Electronic Warfare Division of the avionics laboratory at the Wright Research and Development Center (WRDC) has two in-house facilities which are used in the evaluation of conceptual infrared (IR) and electrooptical (EO) countermeasure techniques. The first facility, called the dynamic infrared missile evaluator (DIME), is a 6-degree of freedom hardware-in-the-loop IR missile simulator. This system is used to evaluate flare and jammer techniques on actual missile guidance and control units under real-time dynamic fly-out conditions. The second facility, called the electrooptical signature analysis system (EOSAS), is an image processing system with software developed to create images of aircraft and characterize their resulting visual and/or infrared signature. This system is used to design and evaluate observable reduction techniques. Both systems provide WRDC with a unique in-house capability for research and development of IR/EO countermeasure techniques
Keywords :
aerospace computing; aerospace simulation; aircraft instrumentation; computerised picture processing; electronic countermeasures; military computing; missiles; real-time systems; IR missile simulator; aircraft; avionics laboratory; computerised picture processing; countermeasure; dynamic infrared missile evaluator; electro-optical signature analysis system; flare; image processing; jammer; missile guidance; real-time dynamic fly-out conditions; Aerospace electronics; Control systems; Electronic countermeasures; Electronic warfare; Image analysis; Jamming; Laboratories; Missiles; Real time systems; Research and development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
Conference_Location :
Dayton, OH
Type :
conf
DOI :
10.1109/NAECON.1990.112968
Filename :
112968
Link To Document :
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