Title :
Qualification & reliability monitoring for small quantity ASIC populations
Author :
Alexander, David R. ; Philpy, Stephen ; Pierce, Donald
Author_Institution :
Air Force Res. Lab., Albuquerque, NM, USA
Abstract :
The authors present a discussion of the issues and an approach for qualification and reliability monitoring for small quantity ASICs used in long lifetime applications. Special attention is given to issues associated with sub-100 nm technologies and the unique challenges posed by new materials and processes.
Keywords :
application specific integrated circuits; nanoelectronics; qualifications; reliability; application specific integrated circuits; long lifetime applications; nanoscale ASIC; qualification; reliability monitoring; Application specific integrated circuits; Costs; Electromigration; Fabrication; Foundries; Monitoring; Probes; Qualifications; Temperature measurement; Testing; ASICs; lifetime; qualification; reliability;
Conference_Titel :
Reliability Physics Symposium, 2009 IEEE International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-2888-5
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2009.5173257
