Improved integrated circuits qualification using Dynamic Laser Stimulation techniques

Dynamic laser stimulation techniques have been developed with success for failure analysis of integrated circuit subjected to ldquosoft defectrdquo. Weakness in design and physical defect can be isolated and located through these methodologies for digital, analog and mixed mode devices. But they are now successfully used embedded in qualification process since they provide accurate information about the device robustness and weaknesses evolutions. Efficiency of this approach has been demonstrated on an EEPROPM.