• DocumentCode
    2670372
  • Title

    Emerging post-CMOS switch options - a product reliability perspective

  • Author

    Bernstein, Kerry

  • Author_Institution
    IBM, Essex Junction, VT, USA
  • fYear
    2009
  • fDate
    26-30 April 2009
  • Firstpage
    273
  • Lastpage
    273
  • Abstract
    Summary form only given: Sooner or later, CMOS scaling will come to an end. What do we do next? A number of very different switches have been proposed as replacements, some of which in fact do not even use electron charge as the state variable. Instead, these switches pass tokens in the spin, excitonic, photonic, magnetic, qubit, or heat domains. The emergent physical behaviors and idiosyncrasies of these novel switches can compliment the execution of specific task algorithms or workloads, and improve overall thru-put in high performance computing. They also present new reliability challenges and perils, however. This talk will describe some of these potential CMOS replacements, how they may be used in design, and the concerns they raise for those who manage product reliability.
  • Keywords
    CMOS integrated circuits; integrated circuit reliability; semiconductor switches; electron charge; high performance computing; post-CMOS switch; product reliability; Electrons; High performance computing; Magnetic domains; Magnetic switching; Physics; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2009 IEEE International
  • Conference_Location
    Montreal, QC
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-2888-5
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2009.5173262
  • Filename
    5173262