DocumentCode
2670372
Title
Emerging post-CMOS switch options - a product reliability perspective
Author
Bernstein, Kerry
Author_Institution
IBM, Essex Junction, VT, USA
fYear
2009
fDate
26-30 April 2009
Firstpage
273
Lastpage
273
Abstract
Summary form only given: Sooner or later, CMOS scaling will come to an end. What do we do next? A number of very different switches have been proposed as replacements, some of which in fact do not even use electron charge as the state variable. Instead, these switches pass tokens in the spin, excitonic, photonic, magnetic, qubit, or heat domains. The emergent physical behaviors and idiosyncrasies of these novel switches can compliment the execution of specific task algorithms or workloads, and improve overall thru-put in high performance computing. They also present new reliability challenges and perils, however. This talk will describe some of these potential CMOS replacements, how they may be used in design, and the concerns they raise for those who manage product reliability.
Keywords
CMOS integrated circuits; integrated circuit reliability; semiconductor switches; electron charge; high performance computing; post-CMOS switch; product reliability; Electrons; High performance computing; Magnetic domains; Magnetic switching; Physics; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 2009 IEEE International
Conference_Location
Montreal, QC
ISSN
1541-7026
Print_ISBN
978-1-4244-2888-5
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2009.5173262
Filename
5173262
Link To Document