DocumentCode :
2670923
Title :
Empirical Analytical Expressions for Fin Line Design
Author :
Sharma, Arvind Kumar ; Hoefer, W.J.R.
fYear :
1981
fDate :
15-19 June 1981
Firstpage :
102
Lastpage :
104
Abstract :
This paper presents empirical expressions in closed form for the design of unilateral and bilateral fin lines. The guided wavelength and the characteristic impedance calculated with these expressions are accurate within typically /spl plusmn/ 2 percent of the values obtained using the spectral domain technique in the normalized frequency range: 0.35 /spl les/ b/lambda /spl les/ 0.70.
Keywords :
Cutoff frequency; Dielectric constant; Dielectric measurements; Erbium; Impedance; Integrated circuit synthesis; Millimeter wave integrated circuits; Millimeter wave propagation; Millimeter wave technology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1981 IEEE MTT-S International
Conference_Location :
Los Angeles, CA, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1981.1129835
Filename :
1129835
Link To Document :
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