DocumentCode
2670944
Title
Experimental Assessment of Bilateral Fin-Line Impedance for Device Matching
Author
Willing, H.A. ; Spielman, B.E.
fYear
1981
fDate
15-19 June 1981
Firstpage
105
Lastpage
107
Abstract
This paper describes the results of an experimental investigation of bilateral fin-line impedance characteristics for matching to small-chip devices. The results from two different experimental approaches are presented and compared with computed results.
Keywords
Dielectric measurements; Finline; Geometry; Impedance; Millimeter wave integrated circuits; Millimeter wave technology; Probes; Rectangular waveguides; Semiconductor device measurement; Waveguide discontinuities;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1981 IEEE MTT-S International
Conference_Location
Los Angeles, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1981.1129836
Filename
1129836
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