Title :
Dynamic Thermal Estimation Methodology for High-Performance 3-D MPSoC
Author :
Zjajo, Amir ; van der Meijs, Nick ; van Leuken, Rene
Author_Institution :
Circuits & Syst., Delft Univ. of Technol., Delft, Netherlands
Abstract :
In 3-D integrated circuits, accurate runtime sensing of on-chip temperature is required to establish dynamic thermal management instruction sets. Placement restrictions and excessive runtime thermal variations, however, compromise the performance and reliability of the sensor readings. Within this framework, a novel methodology for thermal estimation based on unscented Kalman filter, augmented only with a limited number of temperature sensors at a few selected locations, is proposed. In addition, we extend discontinuous Galerkin finite-element method to include coupling mechanism between neighboring grid cells for accurate thermal profile estimation and introduce a balanced stochastic truncation to find a low-dimensional but accurate approximation of the thermal network over the whole frequency domain. As the experimental results show, the runtime thermal estimation method reduces temperature estimation errors by an order of magnitude.
Keywords :
Galerkin method; finite element analysis; integrated circuit packaging; multiprocessing systems; system-on-chip; temperature measurement; thermal management (packaging); three-dimensional integrated circuits; 3D integrated circuits; balanced stochastic truncation; discontinuous Galerkin finite element method; dynamic thermal estimation methodology; dynamic thermal management instruction set; high performance 3D MPSoC; include coupling mechanism; neighboring grid cells; on-chip temperature runtime sensing; placement restrictions; thermal profile estimation; unscented Kalman filter; Estimation; Heating; Integrated circuit modeling; Temperature sensors; Thermal conductivity; Thermal management; 3-D integrated circuits (ICs); multiprocessor system-on-chip (SoC); simulation; thermal analysis; thermal management; thermal management.;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2013.2280667