DocumentCode :
2671276
Title :
Evaluation of accuracy in PS-based radar interferometry with simulated data
Author :
Chen, Qiang ; Ding, Xiaoli ; Liu, Guoxiang ; Li, Yongshu
fYear :
2007
fDate :
23-28 July 2007
Firstpage :
2110
Lastpage :
2113
Abstract :
This paper analyzes the relationship between the noise level in interferometric phases at permanent scatters (PS) and the accuracy in deformation measurements with the PS-based differential SAR interferometry (PS-DInSAR). The study is carried out based on interferograms that are simulated with parameters of 26 ERS-1/2 SAR scenes over Shanghai. The results show that in the cases of high phase signal to noise ratio (noise level lower than plusmn0.5 rad), the accuracy of the deformation rates estimated with PS-DInSAR can be up to about plusmn2 mm/a, and the accuracy of the estimated elevations is about plusmn1 m. The accuracies decrease with the increase of the noise level of the phase data. When the noise level is plusmn0.8 rad, the accuracy of deformation measurements decreases to plusmn1 cm/a and that of elevation measurements decreases to plusmn3 m.
Keywords :
geomorphology; geophysical techniques; radar interferometry; remote sensing by radar; synthetic aperture radar; topography (Earth); ERS-1 SAR; ERS-2 SAR; PS based radar interferometry; PS-DInSAR; Shanghai; deformation measurement accuracy evaluation; differential SAR interferometry; elevation measurements; interferometric phase noise level; permanent scatters; Computer networks; Decorrelation; Deformable models; Noise level; Noise measurement; Phase estimation; Phase measurement; Phase noise; Radar interferometry; Radar scattering; Permanent scatterers; deformation detection; differential SAR interferometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2007. IGARSS 2007. IEEE International
Conference_Location :
Barcelona
Print_ISBN :
978-1-4244-1211-2
Electronic_ISBN :
978-1-4244-1212-9
Type :
conf
DOI :
10.1109/IGARSS.2007.4423250
Filename :
4423250
Link To Document :
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