DocumentCode
2671383
Title
Probe shape effect on near-field enhancement in apertureless terahertz near-field microscope
Author
Trukhin, V.N. ; Golubok, A.O. ; Samoilov, L.L.
Author_Institution
ITMO, NRU, St. Petersburg, Russia
fYear
2011
fDate
2-7 Oct. 2011
Firstpage
1
Lastpage
1
Abstract
Summary form only given. We report on the experimental study of the probe shape dependency on terahertz near-field enhancement near the tip of a metallic probe in the apertureless terahertz scanning near-field microscope. It was established that terahertz near-field signal is strongly controlled by the cone shape of the probe and varies by an order of magnitude depending on the shape of the probe.
Keywords
near-field scanning optical microscopy; terahertz waves; apertureless terahertz scanning near-field microscope; cone shape; metallic probe tip; probe shape effect; terahertz near-field enhancement; terahertz near-field signal; Antennas; Probes; Scanning electron microscopy; Shape; Signal to noise ratio; Tungsten;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location
Houston, TX
ISSN
2162-2027
Print_ISBN
978-1-4577-0510-6
Electronic_ISBN
2162-2027
Type
conf
DOI
10.1109/irmmw-THz.2011.6104848
Filename
6104848
Link To Document