Title :
Probe shape effect on near-field enhancement in apertureless terahertz near-field microscope
Author :
Trukhin, V.N. ; Golubok, A.O. ; Samoilov, L.L.
Author_Institution :
ITMO, NRU, St. Petersburg, Russia
Abstract :
Summary form only given. We report on the experimental study of the probe shape dependency on terahertz near-field enhancement near the tip of a metallic probe in the apertureless terahertz scanning near-field microscope. It was established that terahertz near-field signal is strongly controlled by the cone shape of the probe and varies by an order of magnitude depending on the shape of the probe.
Keywords :
near-field scanning optical microscopy; terahertz waves; apertureless terahertz scanning near-field microscope; cone shape; metallic probe tip; probe shape effect; terahertz near-field enhancement; terahertz near-field signal; Antennas; Probes; Scanning electron microscopy; Shape; Signal to noise ratio; Tungsten;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
DOI :
10.1109/irmmw-THz.2011.6104848
