DocumentCode :
2671432
Title :
An optimal scheme of parallel processing for test generation in a distributed system
Author :
Inoue, Tomoo ; Yonezawa, Tomonori ; Fujiwara, Hideo
Author_Institution :
Adv. Inst. of Sci. & Technol., Ikoma, Nara, Japan
fYear :
1993
fDate :
16-18 Nov 1993
Firstpage :
8
Lastpage :
13
Abstract :
This paper presents an approach to parallel processing of test generation for logic circuits in a loosely-coupled distributed network of general purpose computers. We first analyze the relation between the number of processors and the total processing time for a client-server model (CS model). The result of the analysis shows that for the CS model there exists an optimal number of processors which minimizes the total processing time. In order to get a more efficient scheme than the CS model, we propose another model called a client-agent-server model (CAS model), which is derived by adding agent processors to the CS model. We formulate the problem of test generation on the CAS model, and analyze the relation between the number of processors and the total processing time. Our analysis leads to an optimal scheme for the CAS model which minimizes the total processing time for a given number of processors. We present experimental results for the ISCAS benchmark circuits by implementing the CAS model on a network of workstations
Keywords :
automatic test software; client-server systems; computational complexity; integrated circuit testing; integrated logic circuits; logic testing; minimisation; parallel processing; performance evaluation; probability; ISCAS benchmark circuits; client-agent-server model; client-server model; distributed system; logic circuits; loosely-coupled distributed network; minimisation; network of workstations; parallel processing; probability; processing time; test generation; Benchmark testing; Circuit testing; Computer networks; Concurrent computing; Content addressable storage; Distributed computing; Logic circuits; Logic testing; Parallel processing; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
Type :
conf
DOI :
10.1109/ATS.1993.398772
Filename :
398772
Link To Document :
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