Title :
Proof that Akers´ algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs
Author :
Michinishi, Hiroyuki ; Yokohira, Tokumi ; Okamoto, Takuji
Author_Institution :
Fac. of Eng., Okayama Univ., Japan
Abstract :
In this paper, we prove that Akers´ test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers´ test pattern generator can generate an MLTS for such CUT
Keywords :
automatic testing; built-in self test; combinational circuits; logic testing; matrix algebra; minimisation; Akers´ test generation algorithm; combinational circuit; combinational circuits; linear function assignment algorithm; locally exhaustive testing; minimum test sets; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Concatenated codes; Hardware; Test pattern generators; Vectors;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398773
