• DocumentCode
    2671457
  • Title

    Proof that Akers´ algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

  • Author

    Michinishi, Hiroyuki ; Yokohira, Tokumi ; Okamoto, Takuji

  • Author_Institution
    Fac. of Eng., Okayama Univ., Japan
  • fYear
    1993
  • fDate
    16-18 Nov 1993
  • Firstpage
    14
  • Lastpage
    19
  • Abstract
    In this paper, we prove that Akers´ test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers´ test pattern generator can generate an MLTS for such CUT
  • Keywords
    automatic testing; built-in self test; combinational circuits; logic testing; matrix algebra; minimisation; Akers´ test generation algorithm; combinational circuit; combinational circuits; linear function assignment algorithm; locally exhaustive testing; minimum test sets; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Concatenated codes; Hardware; Test pattern generators; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1993., Proceedings of the Second Asian
  • Conference_Location
    Beijing
  • Print_ISBN
    0-8186-3930-X
  • Type

    conf

  • DOI
    10.1109/ATS.1993.398773
  • Filename
    398773
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2671457