Title :
On the eliminating of parameters α and β in STAFAN
Author :
Ding, J. ; Hu, Jiankun
Author_Institution :
Beijing Univ. of Posts & Telecommun., Beijing
Abstract :
STAFAN algorithm (1985) is regarded as a good alternative to fault simulation of digital circuits. However, this algorithm has two parameters α and β to be determined by fault simulation and so it is of no practical uses. This article analyzes the probability distribution of random signals at circuit nodes, and proves that controllability is in normal distribution. Thus the unbiasing estimate of fault detection probability can be obtained. Moreover, according to the concept of observability, we can eliminate parameter β. For actual circuits the fault coverage obtained from the modified STAFAN agrees favorably with the fault simulation results
Keywords :
controllability; fault location; integrated logic circuits; logic testing; observability; probability; random processes; LSI chips; STAFAN; circuit nodes; combinational circuit; controllability; digital circuits; fault detection probability; fault simulation; normal distribution; observability; probability distribution; random signals; sequential circuit; Circuit faults; Circuit simulation; Digital circuits; Electrical fault detection; Fans; Fault detection; Gaussian distribution; H infinity control; Observability; Probability distribution;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398782