• DocumentCode
    2671648
  • Title

    Parallel computation of LFSR signatures

  • Author

    Narendran, B. ; Franklin, Manoj ; Saluja, Kewal K.

  • Author_Institution
    Dept. of Comput. Sci. Wisconsin Univ., Madison, WI, USA
  • fYear
    1993
  • fDate
    16-18 Nov 1993
  • Firstpage
    75
  • Lastpage
    80
  • Abstract
    Off-line determination of signatures (both good circuit and faulty circuits) for built-in self-test applications is a compute-intensive process that involves cycle-by-cycle simulation of the signature analyzer. In this paper, we present a parallel algorithm that can speed up the computation of (single input and multiple input) LFSR signatures by almost a factor of n, where n is the number of processors used. This parallel algorithm is designed by dividing that total number of time-frames to be simulated into partitions, and assigning each partition to a processor. Each processor determines the contribution of its partition to the final signature, and the contributions of different processors are merged, with very little effort, to obtain a single signature. The speedup given by our parallel algorithm is over and above any speedups provided by other sequential speedup techniques such as the use of lookup tables. We also present the results of a simulation study showing the speedup achieved by the parallel algorithm on a Sequent multiprocessor system
  • Keywords
    automatic testing; built-in self test; computational complexity; logic testing; parallel algorithms; shift registers; BIST; LFSR signatures; Sequent multiprocessor; built-in self-test applications; compute-intensive process; cycle-by-cycle simulation; linear feedback shift register; multiple input shift register; parallel algorithm; sequential speedup; signature analyzer; simulation; Algorithm design and analysis; Analytical models; Built-in self-test; Circuit analysis computing; Circuit faults; Circuit simulation; Computational modeling; Computer applications; Concurrent computing; Parallel algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1993., Proceedings of the Second Asian
  • Conference_Location
    Beijing
  • Print_ISBN
    0-8186-3930-X
  • Type

    conf

  • DOI
    10.1109/ATS.1993.398783
  • Filename
    398783