Test set partitioning and dynamic fault dictionaries for sequential circuits

This paper describes techniques for partitioning test sets and maintaining diagnostic information in partition dictionaries that are appropriate for efficient dynamic fault location. The partitioned test sets and partition dictionary produce a small list of candidate faults, which are further distinguished by a dynamic fault dictionary, created at the time of diagnosis. The dictionaries used are significantly smaller than full dictionaries and are computationally efficient. The approach is shown to be effective on sequential benchmark circuits