• DocumentCode
    2672020
  • Title

    The driver/receiver conflict problem in interconnect testing with boundary-scan

  • Author

    Jin, London

  • Author_Institution
    Vertex Semiconductor, San Jose, CA, USA
  • fYear
    1993
  • fDate
    16-18 Nov 1993
  • Firstpage
    210
  • Lastpage
    214
  • Abstract
    This paper explores the driver/receiver conflict problem in interconnect testing with bidirectional pins and 3-state output pins in boundary-scan. The objective is to have a higher-level (higher than chip) designer be aware of this conflict. Some existing algorithms are reviewed
  • Keywords
    boundary scan testing; design for testability; multichip modules; printed circuit accessories; MCM; PC interconnects; bidirectional pins; boundary-scan; driver/receiver conflict; interconnect testing; Driver circuits; Integrated circuit interconnections; Logic; Pins; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1993., Proceedings of the Second Asian
  • Conference_Location
    Beijing
  • Print_ISBN
    0-8186-3930-X
  • Type

    conf

  • DOI
    10.1109/ATS.1993.398806
  • Filename
    398806
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2672020