Title :
Design and implementation of a JTAG boundary-scan interface controller
Author :
Shen Xu Baang ; Liang Song Hai
Author_Institution :
ShaanXi Microelectron. Res. Inst.
Abstract :
In this paper we present an architecture for JTAG boundary-scan interface controller which we have implemented as a basic RISC microprocessor chip. We also present a JTAG test language which makes the interface between machine and users very friendly
Keywords :
automatic test equipment; automatic test software; boundary scan testing; microcontrollers; reduced instruction set computing; user interfaces; JTAG boundary-scan interface controller; RISC microprocessor chip; architecture; logic structure; test language; user interface; Clocks; Instruments; Integrated circuit testing; Logic testing; Microelectronics; Microprocessor chips; Probes; Reduced instruction set computing; System testing; Very large scale integration;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398807
