DocumentCode
2672387
Title
Application of homing sequences to synchronous sequential circuit testing
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Electr. & Comput. Eng. Dept., Iowa Univ., Iowa City, IA, USA
fYear
1993
fDate
16-18 Nov 1993
Firstpage
324
Lastpage
329
Abstract
A test generation procedure for synchronous sequential circuits is proposed, that is based on the multiple observation times approach, and uses homing sequences, instead of conventionally used synchronizing sequences, to initialize the circuit. A procedure for computing homing sequences in sequential circuits, for which a state-table description is too large to be practical, is described, and experimental results are presented to demonstrate the effectiveness of the proposed test generation procedure
Keywords
automatic testing; logic testing; sequential circuits; automatic testing; effectiveness; homing sequences; multiple observation times; state-table description; synchronous sequential circuit testing; test generation; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Sequential analysis; Sequential circuits; Synchronous generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location
Beijing
Print_ISBN
0-8186-3930-X
Type
conf
DOI
10.1109/ATS.1993.398825
Filename
398825
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