A new dedicated neutron facility for accelerated SEE testing at the ISIS facility

Author

Frost, Christopher D. ; Ansell, Stuart ; Gorini, Giuseppe

Author_Institution

ISIS Facility, STFC Rutherford Appleton Lab., Didcot, UK

fYear

2009

fDate

26-30 April 2009

Firstpage

952

Lastpage

955

Abstract

A new neutron facility for the accelerated testing of electronic components is being designed and built in a joint venture between the Science and Technology Facilities Council (UK) and the Consiglio Nazionale delle Ricerche (Italy) at the ISIS Facility, Rutherford Appleton Laboratory, UK. It aims to help address the increasing demand for neutron facilities of this type and in particular provide neutron test facilities with an atmospheric spectrum extending above 200 MeV to 800 MeV.

Keywords

life testing; neutron effects; semiconductor device reliability; semiconductor device testing; ISIS facility; accelerated SEE testing; electron volt energy 200 MeV to 800 MeV; neutron facility; Aerospace electronics; Aerospace industry; Aerospace testing; Consumer electronics; Electronic equipment testing; Electronics industry; Integrated circuit testing; Intersymbol interference; Life estimation; Neutrons; integrated circuit testing; neutron beams; neutron radiation effects; neutron sources; reliability; thermal neutrons;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 2009 IEEE International

Conference_Location

Montreal, QC

ISSN

1541-7026

Print_ISBN

978-1-4244-2888-5

Electronic_ISBN

1541-7026

Type

conf

DOI

10.1109/IRPS.2009.5173387

Filename

5173387