DocumentCode
2672524
Title
Near-field scanning optical microscopy of photonic crystal high-Q nanocavities
Author
Okamoto, K. ; Loncar, M. ; Yoshie, T. ; Scherer, A. ; Yueming Qiu ; Gogna, P.
Author_Institution
Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA
fYear
2003
fDate
6-6 June 2003
Abstract
Near-field scanning optical microscopy (NSOM) was used to observe high-resolution images of planar photonic crystal nanocavities fabricated in active InGaAsP material. We have observed the smallest optical cavity modes and dielectric band modes.
Keywords
III-V semiconductors; gallium arsenide; indium compounds; localised modes; microcavities; microcavity lasers; near-field scanning optical microscopy; photoluminescence; photonic crystals; InGaAsP; dielectric band modes; high-resolution images; nanocavities; near-field scanning optical microscopy; optical cavity modes; photoluminescence; photonic crystal; Crystalline materials; Dielectrics; Laser beam cutting; Laser excitation; Laser modes; Optical filters; Optical materials; Optical microscopy; Photonic crystals; Pulse measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-749-0
Type
conf
DOI
10.1109/QELS.2003.238278
Filename
1276438
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