DocumentCode
2672549
Title
Quality of PCB Interconnections Based on Blind Microvias Metallized by Magnetron Sputtering Deposition
Author
Borecki, Janusz ; Felba, Jan ; Posadowski, Witold M.
Author_Institution
Tele & Radio Res. Inst., Warsaw
fYear
2006
fDate
10-14 May 2006
Firstpage
98
Lastpage
102
Abstract
The magnetron sputtering deposition process to metallize the high aspect ratio (deep/diameter) blind microvias was used. In this technique it is innovative that magnetron sputtering deposition process can be used with self-sustaining mode. This mode allows to deposit of very clear (without any labour gas particles) electro-conductive layers (Radzimski et al., 1998). Typically, the thickness of deposited layers is about few micrometers and with success it can be used as electro-conductive connections. However, the thickness of connections can be grown in electroplating processes to decrease its resistance. In the paper the results of first trials of electro-conductive base-layers growing are presented. The big advantage of magnetron sputtering deposition technique is possibility of increasing the aspect ratio of micro-connections in PCBs (printed circuit boards) even several times. This technique was used successfully for metallization of high aspect ratio blind microvias. It was proved that investigated process can be useful in HDI (high density interconnections) PCBs manufacturing.
Keywords
interconnections; printed circuits; sputtered coatings; sputtering; PCB interconnections; PCBs manufacturing; blind microvias; electro-conductive base-layers growing; electro-conductive connections; electro-conductive layers; electroplating; high density interconnections; labour gas particles; magnetron sputtering deposition; micro-connections; self-sustaining mode; Metallization; Sputtering;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology, 2006. ISSE '06. 29th International Spring Seminar on
Conference_Location
St. Marienthal
Print_ISBN
1-4244-0551-3
Electronic_ISBN
1-4244-0551-3
Type
conf
DOI
10.1109/ISSE.2006.365366
Filename
4216006
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