• DocumentCode
    2672549
  • Title

    Quality of PCB Interconnections Based on Blind Microvias Metallized by Magnetron Sputtering Deposition

  • Author

    Borecki, Janusz ; Felba, Jan ; Posadowski, Witold M.

  • Author_Institution
    Tele & Radio Res. Inst., Warsaw
  • fYear
    2006
  • fDate
    10-14 May 2006
  • Firstpage
    98
  • Lastpage
    102
  • Abstract
    The magnetron sputtering deposition process to metallize the high aspect ratio (deep/diameter) blind microvias was used. In this technique it is innovative that magnetron sputtering deposition process can be used with self-sustaining mode. This mode allows to deposit of very clear (without any labour gas particles) electro-conductive layers (Radzimski et al., 1998). Typically, the thickness of deposited layers is about few micrometers and with success it can be used as electro-conductive connections. However, the thickness of connections can be grown in electroplating processes to decrease its resistance. In the paper the results of first trials of electro-conductive base-layers growing are presented. The big advantage of magnetron sputtering deposition technique is possibility of increasing the aspect ratio of micro-connections in PCBs (printed circuit boards) even several times. This technique was used successfully for metallization of high aspect ratio blind microvias. It was proved that investigated process can be useful in HDI (high density interconnections) PCBs manufacturing.
  • Keywords
    interconnections; printed circuits; sputtered coatings; sputtering; PCB interconnections; PCBs manufacturing; blind microvias; electro-conductive base-layers growing; electro-conductive connections; electro-conductive layers; electroplating; high density interconnections; labour gas particles; magnetron sputtering deposition; micro-connections; self-sustaining mode; Metallization; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2006. ISSE '06. 29th International Spring Seminar on
  • Conference_Location
    St. Marienthal
  • Print_ISBN
    1-4244-0551-3
  • Electronic_ISBN
    1-4244-0551-3
  • Type

    conf

  • DOI
    10.1109/ISSE.2006.365366
  • Filename
    4216006