DocumentCode
2672696
Title
Phase response of cut-off metallic hole arrays
Author
Beruete, M. ; Campillo, I. ; Dolado, J.S. ; Sorolla, M. ; Lomakin, V. ; Michielsen, E.
Author_Institution
Dept. de Electr. & Electron. Eng., Univ. Publica de Navarra, Pamplona, Spain
fYear
2005
fDate
3-8 July 2005
Firstpage
734
Abstract
The paper presents numerical and experimental studies of the phase of the millimeter wave transmission response of a metal plate perforated by an array of subwavelength holes as a complimentary extension of our earlier results for the magnitude of the transmission response exhibiting extraordinary transmission properties (Gomez Rivas, J. et al., Phys. Rev. B, vol.68, art.201306(R), 2003). For the experimental study, prototypes were fabricated in aluminum plates and phase measurements were performed using a millimeter wave quasioptical vector network analyzer. For the numerical study, it was assumed that the structure was infinitely periodic. The experimental results match well the numerical predictions. It was demonstrated that the transmission response phase behavior is governed by resonant and Rayleigh Wood anomalies. Currently, ongoing studies target optimization of the transmission response by properly choosing the plate size and thickness, and incorporating layered media environments. Applications to frequency selective surfaces and other quasioptical structures are anticipated.
Keywords
electromagnetic wave transmission; millimetre wave propagation; Rayleigh Wood anomalies; aluminum plates; cut-off metallic hole array phase response; frequency selective surfaces; layered media; millimeter wave quasioptical vector network analyzer; millimeter wave transmission response; quasioptical structures; resonant anomalies; subwavelength holes; Aluminum; Millimeter wave measurements; Nonhomogeneous media; Performance analysis; Performance evaluation; Periodic structures; Phase measurement; Phased arrays; Prototypes; Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN
0-7803-8883-6
Type
conf
DOI
10.1109/APS.2005.1551427
Filename
1551427
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