DocumentCode
2672789
Title
Investigation on Functional and Reliability Properties of IR Heaters for Soldering Processes in Connection with Spectral Characteristics of Radiation Control
Author
Kontrov, S. ; Marinova, M. ; Mashkov, P. ; Pencheva, T.
Author_Institution
Tech. Univ., Varna
fYear
2006
fDate
10-14 May 2006
Firstpage
197
Lastpage
201
Abstract
In the article an approach for estimation of the longevity and reliability of low inert heating elements for the middle IR spectral region is proposed. Investigations deal with application of low inert heaters at soldering processes of SMDs. They possess a lot of advantages with respect to conventional heaters for the same purpose, especially to control in situ the spectral characteristics of radiation according to absorption properties of the heated objects. To ensure proper power radiation in the spectral region of lambda=2-3 mum from the same heaters their surface temperature should be raised at least to 1000 K while their operation temperature isn´t usually more than 720 K. The ageing law based on design and technological peculiarities of used low inert heating elements is proposed. Applying statistical approach operating durability of the heaters is evaluated. It allows estimation of the parameters of accelerated reliability tests as well as the influence of different operation factors on the low inert IR heaters life. The possibility of realization of versatile IR heating regimes which differ in power and spectral distribution of radiation is evaluated.
Keywords
heating elements; life testing; radiation hardening (electronics); reliability; soldering; statistical analysis; surface mount technology; thermal management (packaging); IR heaters; SMD; absorption properties; accelerated reliability tests; low inert heating elements; middle IR spectral region; radiation control; reliability properties; soldering processes; spectral characteristics; statistical approach; wavelength 2 mum to 3 mum; Belts; Cameras; Heating; Life estimation; Microprocessors; Physics; Soldering; Temperature control; Temperature dependence; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology, 2006. ISSE '06. 29th International Spring Seminar on
Conference_Location
St. Marienthal
Print_ISBN
1-4244-0551-3
Electronic_ISBN
1-4244-0551-3
Type
conf
DOI
10.1109/ISSE.2006.365385
Filename
4216025
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