DocumentCode :
267292
Title :
A unified power quality conditioner for the fault ride-through operation of photovoltaic power station
Author :
Xuefeng Ge ; Feng Gao ; Guoqing He ; Guanghui Li
Author_Institution :
Sch. of Electr. Eng., Shandong Univ., Jinan, China
fYear :
2014
fDate :
5-8 Nov. 2014
Firstpage :
566
Lastpage :
571
Abstract :
This paper presents a unified power quality conditioner (UPQC) and its control strategy for assisting the fault ride-through operation of large-scale photovoltaic (PV) power station. The output voltage of PV station can be controlled to its rated value with UPQC under high grid voltage fault condition. Moreover, it can absorb reactive power from the grid under high voltage condition to support the grid voltage recovery without reducing the injected real power from PV station. The UPQC could also compensate the grid harmonic voltages under various operation conditions, which in consequence can minimize the response time of phase-locked-loops (PLL) embedded in the control loop of grid-tied PV inverters. The UPQC helps the PV station output the required reactive power for enhancing the low voltage ride through performance. Furthermore, the performance of proposed UPQC system with a 100MW grid-tied PV station has been verified by MATLAB/SIMULINK.
Keywords :
invertors; phase locked loops; photovoltaic power systems; power supply quality; power system control; power system faults; power system harmonics; reactive power; PLL; PV station; UPQC control strategy; fault ride-through operation; grid harmonic voltage; grid voltage fault condition; grid voltage recovery; grid-tied PV inverter control loop; phase-locked-loop; photovoltaic power station; power 100 MW; reactive power; real power injected; response time; unified power quality conditioner; Equations; Harmonic analysis; Inverters; Low voltage; Mathematical model; Reactive power; Voltage control; fault ride-through; harmonic voltage compensation; reactive power compensation; unified power quality conditioner (UPQC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Application Conference and Exposition (PEAC), 2014 International
Conference_Location :
Shanghai
Type :
conf
DOI :
10.1109/PEAC.2014.7037918
Filename :
7037918
Link To Document :
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