Title :
Investigations of Electrical Behaviours of Grain Bounadries in Polycrystalline Silicon Solar Cells by EBIC and OBIC
Author :
Kaczmarek, D. ; Domaradzki, J. ; Borkowska, A.
Author_Institution :
Wroclaw Univ. of Technol., Warsaw
Abstract :
In this work, an application of two non-destructive beam injection methods: Electron Beam Induced Current (EBIC) and Light Beam Induced Current (LBIC) for evaluation of electrical properties of grain boundaries in polycrystalline silicon solar cells have been described. The methods reveal study of the lateral distribution of the current generated by focused electron and light beams and thus the study of local recombination of the charge carriers due to the presence of boundaries.
Keywords :
EBIC; OBIC; elemental semiconductors; grain boundaries; hot carriers; silicon; solar cells; EBIC; LBIC; Si; charge carriers; electron beam induced current; focused electron generated current; grain boundaries; light beam induced current; polycrystalline silicon solar cells; Charge carriers; Costs; Electron beams; Fabrication; Grain boundaries; Optical beams; Photovoltaic cells; Semiconductor materials; Silicon; Stress;
Conference_Titel :
Electronics Technology, 2006. ISSE '06. 29th International Spring Seminar on
Conference_Location :
St. Marienthal
Print_ISBN :
1-4244-0551-3
Electronic_ISBN :
1-4244-0551-3
DOI :
10.1109/ISSE.2006.365117
