DocumentCode :
2673143
Title :
Detection of chaotic determinism in stochastic short time series
Author :
Chon, K.H. ; Kanters, J.K. ; Iyengar, N. ; Cohen, R.J. ; Holstein-Rathlou, N.H.
Author_Institution :
City University of Hong Kong
Volume :
1
fYear :
1997
fDate :
Oct. 30 1997-Nov. 2 1997
Firstpage :
275
Lastpage :
277
Abstract :
We have developed an algorithm based on the nonlinear autoregressive (NAR) model which is very accurate in determining whether chaotic determinism is present in a noisy time series and is effective even for a time series with as few as 500 data points. The algorithm is based on fitting a deterministic and stochastic nonlinear autoregressive (NAR) model to the time series, followed by an estimation of the Lyapunov exponents of the resultant fitted model. The major benefits of this algorithm are: 1) it provides accurate parameter estimation with as few as 500 data points, 2) it is accurate down to signal-to-noise ratios (SNRs) of -9 dB (variance of the noise is approximately 2.9 times greater than the variance of the signal), and 3) it allows characterization of the dynamics of the system, and thus prediction of future states of the system. The advantages of the developed algorithm allow this method to be superior to the conventional algorithms for calculating Lyapunov exponents.
Keywords :
chaos; electrocardiography; medical signal detectionthematical; parameter estimation; physiological models; time series; ECG analysis; Lyapunov exponents estimation; chaotic determinism detection; data points; deterministic stochastic nonlinear autoregressive model; electrodiagnostics; heart rate data correlation dimension; system dynamics characterization; system future states prediction; Chaos; Electronic mail; Equations; Heart rate; Logistics; Medical diagnostic imaging; Parameter estimation; Physiology; Signal to noise ratio; Stochastic processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
1094-687X
Print_ISBN :
0-7803-4262-3
Type :
conf
DOI :
10.1109/IEMBS.1997.754524
Filename :
754524
Link To Document :
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