Title :
Theil index for aggregation of software metrics values
Author :
Serebrenik, Alexander ; van den Brand, Mark
Author_Institution :
Tech. Univ. Eindhoven, Eindhoven, Netherlands
Abstract :
We propose a new approach to aggregating software metrics from the micro-level of individual artifacts (e.g., methods, classes and packages) to the macro-level of the entire software system. The approach, Theil index, is a well-known econometric measure of inequality. The Theil index allows to study the impact of different categorizations of the artifacts, e.g., based on the development technology or developers´ teams, on the inequality of the metrics values measured. We apply the Theil index in a series of experiments. We have observed that the Theil index and the related notions provide valuable insights in organization and evolution of software systems, as well as in sources of inequality.
Keywords :
econometrics; software metrics; Theil index; econometric inequality measure; software metrics aggregation; software metrics values; Econometrics; Indexes; Software metrics; Software systems; Theil index; distribution; software metrics;
Conference_Titel :
Software Maintenance (ICSM), 2010 IEEE International Conference on
Conference_Location :
Timisoara
Print_ISBN :
978-1-4244-8630-4
Electronic_ISBN :
1063-6773
DOI :
10.1109/ICSM.2010.5609637