DocumentCode :
2673441
Title :
Automated pavement distress inspection based on 2D and 3D information
Author :
Salari, E. ; Bao, G.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Toledo, Toledo, OH, USA
fYear :
2011
fDate :
15-17 May 2011
Firstpage :
1
Lastpage :
4
Abstract :
During the last few decades, many efforts have been made to produce automatic inspection systems to meet the specific requirements in assessing distress on the road surfaces using video cameras and image processing algorithms. However, due to the noisy images from pavement surfaces, limited success was accomplished. One major issue with pure video based systems is their inability to discriminate dark areas not caused by pavement distress such as tire marks, oil spills, shadows, and recent fillings. To overcome the limitation of the conventional imaging based methods, a probabilistic relaxation technique based on 3-dimensional (3D) information is proposed in this paper. The primary goal of this technique is to integrate conventional image processing techniques with stereovision technology to obtain an accurate topological structure of the road defects. Simulation results show the proposed system is effective and robust on a variety of pavement surfaces.
Keywords :
automatic optical inspection; computer vision; image denoising; probability; roads; stereo image processing; structural engineering computing; video cameras; 3-dimensional information; automated pavement distress inspection; dark areas; image processing algorithms; noisy images; probabilistic relaxation technique; road defects; road surfaces; stereovision technology; video cameras; Histograms; Pixel; Roads; Surface reconstruction; Surface treatment; Three dimensional displays; Tiles; Pavement inspection; neural network; relaxation; stereovision;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electro/Information Technology (EIT), 2011 IEEE International Conference on
Conference_Location :
Mankato, MN
ISSN :
2154-0357
Print_ISBN :
978-1-61284-465-7
Type :
conf
DOI :
10.1109/EIT.2011.5978575
Filename :
5978575
Link To Document :
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