The device of research on relay contact reliability

Author

Lu Jianguo ; Zhigang, Li ; Jinqin, Wang

Author_Institution

Hebei Inst. of Technol., Tianjin, China

fYear

1990

fDate

20-24 Aug 1990

Firstpage

102

Lastpage

109

Abstract

A device for research into relay contact reliability is described. Since 64 pairs of contacts may be monitored at the same time, the device can be used to statistically research the contact resistance of relay contacts. The contact drop of all the contacts can be measured periodically and automatically, and thus the device may be used to investigate the variations of contact resistance throughout the life of the test relays. The device can also be used for reliability tests, since contact drop and open circuit voltage are measured at every operation. Failure occurs if the contact drop is too high or the open circuit voltage is too low. Test results and the method of data processing are discussed and analyzed

Keywords

electrical contacts; life testing; relays; reliability; contact drop; contact resistance; data processing; life; open circuit voltage; relay contact reliability; Automatic testing; Circuit testing; Contact resistance; Data processing; Electrical resistance measurement; Life testing; Low voltage; Monitoring; Relays; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts

Conference_Location

Montreal, Que.

Type

conf

DOI

10.1109/HOLM.1990.113003

Filename

113003