DocumentCode :
2673996
Title :
Computation and Measurement of High Field Phenomena in Dielectrics
Author :
Xu, Chunchuan ; Ho, Janet ; Boggs, Steven
Author_Institution :
Dept. of Phy. & Electr. Eng., Connecticut Univ., Storrs, CT
fYear :
2006
fDate :
14-18 May 2006
Firstpage :
49
Lastpage :
54
Abstract :
Polymeric dielectrics have two electric field "thresholds", the first where conduction goes from linear to nonlinear, which is typically in the range of 10 V/m, and the second where carriers attain high mobility, which is typically in the range of 3times10 V/m. The latter is of great importance, as under the action of a cyclic field, the dielectric will degrade rapidly as a result of hot electrons, UV photons, etc. This paper will review important high field phenomena in dielectrics along with the methods used to measure and compute them
Keywords :
dielectric materials; dielectric measurement; electric field measurement; polymers; carrier mobility; dielectric measurement; electric field measurement; polymeric dielectrics; Dielectric constant; Dielectric materials; Dielectric measurements; Electron traps; Inorganic materials; Polymers; Space charge; Stress; Thermal conductivity; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator Symposium, 2006. Conference Record of the 2006 Twenty-Seventh International
Conference_Location :
Arlington, VA
Print_ISBN :
1-4244-0018-X
Electronic_ISBN :
1-4244-0019-8
Type :
conf
DOI :
10.1109/MODSYM.2006.365180
Filename :
4216132
Link To Document :
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