Title :
Research on the optimum design of building photovoltaic based on the radiation model evaluation on vertical surface in Beijing
Author :
Fen Li ; Nianjun Ma ; Jinbin Zhao ; Jinlong Wang ; Zeqiang Bian
Author_Institution :
Coll. of Electr. Eng., Shanghai Univ. of Electr. Power, Shanghai, China
Abstract :
Three typical models of Liu and Jordon´s isotropic (extended by Klein), Hay´s anisotropic model and Reindl´s anisotropic model to estimate monthly-average daily total radiation on vertical surfaces with azimuth form -90° to 90° are investigated by detail. Based on the measurement of global, beam, diffused, and ground reflected radiation on the horizontal surfaces, total radiation on south-facing, east-facing and west-facing vertical surfaces for Beijing (39°48´N and 116°28´E) during the whole year (March of 2010 to February of 2011), the objective in this investigation is to perform a statistical comparison, such as, mean bias error (MBE), mean absolute percentage error (MAPE), normalized root mean square error (NRMSE), correlation factor(CORR), to recommend one that is applicable for estimating the solar radiation on vertical surface and optimization design of building photovoltaic system for Beijing.
Keywords :
building integrated photovoltaics; design engineering; estimation theory; solar radiation; statistical analysis; Beijing; CORR; Hay´s anisotropic model; Liu and Jordon isotropic models; MAPE; MBE; NRMSE; Reindl´s anisotropic model; building photovoltaic system; correlation factor; east-facing vertical surfaces; global beam diffused ground reflected radiation measurement; horizontal surfaces; mean absolute percentage error; mean bias error; monthly-average daily total radiation estimation; normalized root mean square error; optimization design; solar radiation model evaluation; south-facing vertical surfaces; statistical comparison; west- facing vertical surfaces; Azimuth; Buildings; Estimation; Photovoltaic systems; Solar energy; Solar radiation; anisotropic; isotropic; photovoltaic; solar radiation;
Conference_Titel :
Electronics and Application Conference and Exposition (PEAC), 2014 International
Conference_Location :
Shanghai
DOI :
10.1109/PEAC.2014.7038034
