DocumentCode :
2674129
Title :
Deteriorating mechanisms of silver and tin plated copper connectors subjected to an oscillating movement
Author :
Kassman, Asa ; Imrell, Torbjörn ; Hogmark, Sture ; Jacobson, Staffan
Author_Institution :
Dept. of Technol., Uppsala Univ., Sweden
fYear :
1990
fDate :
20-24 Aug 1990
Firstpage :
395
Lastpage :
401
Abstract :
The influence of vibration on the deterioration of the contact surfaces of a separable connector system is studied. The connector has a movable plug-in part and a stationary bus bar. Both contact members are made of electroplated copper. Which deterioration processes are dominant for different combinations of material and contact parameters is discussed, and how they relate to contact resistance and friction force is addressed. The influence of normal load, coating material (Ag, Sn), and lubrication on wear and contact resistance in current loaded connections are investigated in laboratory tests. Extensive scanning electron microscopy of surfaces and cross-sections of the contact areas are used to study the processes. Short time vibration tests proved to be a valuable means for investigating the performance of electrical contacts. It is concluded that with the most beneficial parameter combination, high load and application of grease, the two tested material combinations behaved equally well
Keywords :
contact resistance; copper; electric connectors; scanning electron microscope examination of materials; silver; tin; wear; Au-Cu; Sn-Cu; coating material; contact parameters; contact resistance; contact surfaces; deterioration; friction force; grease; lubrication; movable plug-in part; normal load; oscillating movement; scanning electron microscopy; separable connector system; stationary bus bar; vibration; wear; Coatings; Connectors; Contact resistance; Copper; Friction; Lubrication; Materials testing; Silver; Surface resistance; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts
Conference_Location :
Montreal, Que.
Type :
conf
DOI :
10.1109/HOLM.1990.113035
Filename :
113035
Link To Document :
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