• DocumentCode
    2674381
  • Title

    An Eclipse plug-in for the detection of design pattern instances through static and dynamic analysis

  • Author

    De Lucia, Andrea ; Deufemia, Vincenzo ; Gravino, Carmine ; Risi, Michele

  • Author_Institution
    Dipt. di Mat. e Inf., Univ. degli Studi di Salerno, Fisciano, Italy
  • fYear
    2010
  • fDate
    12-18 Sept. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The extraction of design pattern information from software systems can provide conspicuous insight to software engineers on the software structure and its internal characteristics. In this demonstration we present ePAD, an Eclipse plug-in for recovering design pattern instances from object-oriented source code. The tool is able to recover design pattern instances through a structural analysis performed on a data model extracted from source code, and a behavioral analysis performed through the instrumentation and the monitoring of the software system. ePAD is fully configurable since it allows software engineers to customize the design pattern recovery rules and the layout used for the visualization of the recovered instances.
  • Keywords
    object-oriented programming; program diagnostics; software tools; Eclipse plug-in; design pattern detection; design pattern information extraction; design pattern recovery rules; dynamic analysis; ePAD; object-oriented source code; software engineers; software systems; static analysis; Eclipse plug-in; design pattern recovery; reverse engineering; source code analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Maintenance (ICSM), 2010 IEEE International Conference on
  • Conference_Location
    Timisoara
  • ISSN
    1063-6773
  • Print_ISBN
    978-1-4244-8630-4
  • Electronic_ISBN
    1063-6773
  • Type

    conf

  • DOI
    10.1109/ICSM.2010.5609707
  • Filename
    5609707