DocumentCode :
2674511
Title :
A DFT Technique to Improve ATPG Efficiency for Sequential Circuits
Author :
Bertrand, Y. ; Bancel, F. ; Renovell, M.
Author_Institution :
Universite de Montpelier II: Sciences et Techniques du Languedoc
fYear :
1993
fDate :
3-6 Jan 1993
Firstpage :
51
Lastpage :
54
Keywords :
Automatic test pattern generation; Circuit testing; Controllability; Design for testability; Guidelines; Observability; Registers; Robots; Sequential analysis; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-3180-5
Type :
conf
DOI :
10.1109/ICVD.1993.669637
Filename :
669637
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2674511
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