• DocumentCode
    2674511
  • Title

    A DFT Technique to Improve ATPG Efficiency for Sequential Circuits

  • Author

    Bertrand, Y. ; Bancel, F. ; Renovell, M.

  • Author_Institution
    Universite de Montpelier II: Sciences et Techniques du Languedoc
  • fYear
    1993
  • fDate
    3-6 Jan 1993
  • Firstpage
    51
  • Lastpage
    54
  • Keywords
    Automatic test pattern generation; Circuit testing; Controllability; Design for testability; Guidelines; Observability; Registers; Robots; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1993. Proceedings. The Sixth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-3180-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1993.669637
  • Filename
    669637
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2674511