DocumentCode :
2674516
Title :
A near-field millimeter-wave dielectric imaging technique with sub-wavelength spatial resolution
Author :
Babakhani, Aydin ; Liu, Duixian ; Sanduleanu, Mihai ; Reynolds, Scott
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
2011
fDate :
2-7 Oct. 2011
Firstpage :
1
Lastpage :
2
Abstract :
A near-field millimeter-wave imaging technique is introduced which is capable of producing images with sub-wavelength resolution. A phantom made of a Teflon board containing samples of different materials with dielectric constants ranging from 1 to 48 was built, and a near-field loop antenna and a 110GHz vector network analyzer were used to capture near-field images of the Teflon board. A novel image processing method is described that is capable of achieving an image resolution of 0.5mm at 110GHz.
Keywords :
dielectric materials; image resolution; loop antennas; millimetre wave imaging; network analysers; Teflon board; dielectric constant; frequency 110 GHz; image processing method; image resolution; near-field loop antenna; near-field millimeter-wave dielectric imaging technique; subwavelength spatial resolution; vector network analyzer; Antennas; Dielectric constant; Imaging; Materials; Millimeter wave technology; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
ISSN :
2162-2027
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
Type :
conf
DOI :
10.1109/irmmw-THz.2011.6105018
Filename :
6105018
Link To Document :
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