Title :
Four transistors self-checking differential XOR
Author :
Hamdi, Belgacem ; Chiraz, Khedhiri ; Aymen, Fradi ; Rached, Tourki
Author_Institution :
ISSAT, Sousse, Tunisia
fDate :
June 30 2011-July 1 2011
Abstract :
Self-checking designs will gain increasing interest in industrial applications if they satisfy the following requirements: high fault coverage and reduced hardware cost with reduced design effort. The aim of this work is to contribute to reach these requirements for the design of self-checking adders/ALUs. In this paper, we present efficient self-checking XOR implementation for schemes using the dual duplication code. Among the known self-checking adder designs, the dual duplicated scheme has the advantage to be totally self-checking for single faults. The drawback of this scheme is that it requires generally the maximum hardware overhead. In this work, we propose a low cost self-checking implementation. The proposed design is a novel differential XOR gate implemented in CMOS pass transistor logic, and performed with only four transistors.
Keywords :
CMOS digital integrated circuits; adders; integrated circuit design; logic gates; CMOS pass transistor logic; design effort reduction; differential XOR gate; dual duplication code; hardware cost reduction; high fault coverage; industrial applications; maximum hardware overhead; self-checking adder designs; self-checking differential XOR; Adders; Built-in self-test; CMOS integrated circuits; Circuit faults; Fault detection; Logic gates; Transistors; CMOS Logic Styles; CMOS pass transistor logic; differential XOR; totally self-checking circuits;
Conference_Titel :
Signals, Circuits and Systems (ISSCS), 2011 10th International Symposium on
Conference_Location :
lasi
Print_ISBN :
978-1-61284-944-7
DOI :
10.1109/ISSCS.2011.5978642