DocumentCode
2674642
Title
Evaluation of a 10 kV, 400 kA Si SGTO at High dI/dt
Author
Brien, Heather O. ; Shaheen, William ; Crowley, Timothy ; Bayne, Stephen B.
Author_Institution
Berkeley Res. Associates, U.S. Army Res. Lab., Adelphi, MD
fYear
2006
fDate
14-18 May 2006
Firstpage
236
Lastpage
239
Abstract
The evaluation of each 10 kV, 400 kA Si SGTO included a visual inspection and high-potting of each component module prior to pulsing. The complete unit was then switched in a low inductance RLC circuit to test voltage and current capabilities and maximize dl/dt. Devices were switched as many as 70 times without failure. Voltage sharing between the layers was within plusmn2%, and current sharing between the modules was plusmn5% of ideal sharing. The peak rate of current rise attained was 40 kA/mus, and the 50% pulse width of the current was 26 mus. The peak power switched was 1.06 GW, and the action of the forward current pulse reached 6.4 MA2s. This report includes details on the methods for evaluating the 400 kA SGTO, challenges faced and peak performance of the devices under single shot pulsing conditions
Keywords
RLC circuits; power semiconductor switches; silicon; thyristors; 1.06 GW; 10 kV; 26 mus; 400 kA; Si; Si SGTO; current sharing; low inductance RLC circuit; shot pulsing conditions; visual inspection; voltage sharing; Anodes; Circuit testing; Inductance; Laboratories; Optical switches; Powders; Pulse transformers; RLC circuits; Switching circuits; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Modulator Symposium, 2006. Conference Record of the 2006 Twenty-Seventh International
Conference_Location
Arlington, VA
Print_ISBN
1-4244-0018-X
Electronic_ISBN
1-4244-0019-8
Type
conf
DOI
10.1109/MODSYM.2006.365226
Filename
4216178
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