DocumentCode :
2674715
Title :
Statistical Analysis of Controllability
Author :
Majumdar, Amitava ; Sastry, Sarma
Author_Institution :
Southern Illinois Univ
fYear :
1993
fDate :
3-6 Jan 1993
Firstpage :
55
Lastpage :
60
Keywords :
Aggregates; Ambient intelligence; Automatic test pattern generation; Circuit analysis; Combinational circuits; Controllability; Logic; Probability; Signal analysis; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-3180-5
Type :
conf
DOI :
10.1109/ICVD.1993.669638
Filename :
669638
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2674715
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