• DocumentCode
    2674880
  • Title

    CACOP - A Random Pattern Testability Analyzer

  • Author

    Jone, Wen-Ben ; Das, Sunil R.

  • Author_Institution
    New Mexico Tech
  • fYear
    1993
  • fDate
    3-6 Jan 1993
  • Firstpage
    61
  • Lastpage
    64
  • Keywords
    Algorithm design and analysis; Analytical models; Circuit faults; Circuit testing; Computational modeling; Electrical fault detection; Fault detection; Observability; Pattern analysis; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1993. Proceedings. The Sixth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-3180-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1993.669639
  • Filename
    669639
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2674880