DocumentCode :
2674880
Title :
CACOP - A Random Pattern Testability Analyzer
Author :
Jone, Wen-Ben ; Das, Sunil R.
Author_Institution :
New Mexico Tech
fYear :
1993
fDate :
3-6 Jan 1993
Firstpage :
61
Lastpage :
64
Keywords :
Algorithm design and analysis; Analytical models; Circuit faults; Circuit testing; Computational modeling; Electrical fault detection; Fault detection; Observability; Pattern analysis; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-3180-5
Type :
conf
DOI :
10.1109/ICVD.1993.669639
Filename :
669639
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2674880
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