• DocumentCode
    2674982
  • Title

    Probing thermal evanescent fields with a near-field microscope

  • Author

    Kajihara, Yusuke ; Kosaka, Keishi ; Komiyama, Susumu

  • Author_Institution
    Dept. of Basic Sci., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2011
  • fDate
    2-7 Oct. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrate probing thermally activated surface waves with a passive near-field microscope (wavelength λ: ~14.5 μm) without external illumination. A clear passive image of a room temperature object is achieved with a spatial resolution of 60 nm (λ/240). The decay characteristic of thermal evanescent waves on Au is quantitatively consistent with a numerical prediction based on the theories considering the thermal energy localization and the scattering efficiency of the near-field. In addition, the sample-size and temperature dependence of the near-field thermal signals agrees well with the theoretical calculations.
  • Keywords
    numerical analysis; optical microscopy; surface waves (fluid); thermal variables measurement; near-field thermal signals; numerical prediction; passive near-field microscope; thermal energy localization; thermal evanescent fields; thermally activated surface waves; wavelength 14.5 mum; wavelength 60 nm; Gold; Materials; Microscopy; Optical microscopy; Probes; Silicon carbide; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
  • Conference_Location
    Houston, TX
  • ISSN
    2162-2027
  • Print_ISBN
    978-1-4577-0510-6
  • Electronic_ISBN
    2162-2027
  • Type

    conf

  • DOI
    10.1109/irmmw-THz.2011.6105044
  • Filename
    6105044